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 2SK3662
TOSHIBA Field Effect Transistor Silicon N Channel MOS Type (-MOSII)
2SK3662
Switching Regulator, DC-DC Converter, Motor Drive Applications
* * * * Low drain-source ON resistance: RDS (ON) = 9.4 m (typ.) High forward transfer admittance: |Yfs| = 55 S (typ.) Low leakage current: IDSS = 100 A (max) (VDS = 60 V) Enhancement mode : Vth = 1.3 to 2.5 V (VDS = 10 V, ID = 1 mA) Unit: mm
Absolute Maximum Ratings (Ta = 25C)
Characteristics Drain-source voltage Drain-gate voltage (RGS = 20 k) Gate-source voltage Drain current DC (Note 1) Symbol VDSS VDGR VGSS ID IDP PD EAS IAR (Note 3) Channel temperature Storage temperature range EAR Tch Tstg Rating 60 60 20 35 105 35 204 35 3.5 150 -55 to 150 Unit V V V A W mJ A mJ C C
Pulse (Note 1) Drain power dissipation (Tc = 25C) Single pulse avalanche energy (Note 2) Avalanche current Repetitive avalanche energy
JEDEC JEITA TOSHIBA
SC-67 2-10R1B
Weight: 1.9 g (typ.)
Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the significant change in
temperature, etc.) may cause this product to decrease in the reliability significantly even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum ratings. Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook ("Handling Precautions"/Derating Concept and Methods) and individual reliability data (i.e. reliability test report and estimated failure rate, etc).
Thermal Characteristics
Characteristics Thermal resistance, channel to case Thermal resistance, channel to ambient Symbol Rth (ch-c) Rth (ch-a) Max 3.57 62.5 Unit C/ W C/ W
Note 1:
Ensure that the channel temperature does not exceed 150C.
Note 2: VDD = 25 V, Tch = 25C (initial), L = 227 H, IAR = 35 A, RG = 25 Note 3: Repetitive rating: pulse width limited by maximum channel temperature This transistor is an electrostatic-sensitive device. Please handle with caution.
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2SK3662
Electrical Characteristics (Ta = 25C)
Characteristics Gate leakage current Drain cut-off current Drain-source breakdown voltage Gate threshold voltage Drain-source ON resistance Forward transfer admittance Input capacitance Reverse transfer capacitance Output capacitance Rise time Turn-on time Switching time Fall time Turn-off time Total gate charge (gate-source plus gate-drain) Gate-source charge Gate-drain ("miller") charge tf toff Qg Qgs Qgd Symbol IGSS IDSS V (BR) DSS V (BR) DSX Vth RDS (ON) |Yfs| Ciss Crss Coss tr ton 10 V VGS 0V 4.7 ID = 18 A RL = 1.67 VOUT VDS = 10 V, VGS = 0 V, f = 1 MHz Test Condition VGS = 16 V, VDS = 0 V VDS = 60 V, VGS = 0 V ID = 10 mA, VGS = 0 V ID = 10 mA, VGS = -20 V VDS = 10 V, ID = 1 mA VGS = 4 V, ID = 18 A VGS = 10 V, ID = 18 A VDS = 10 V, ID = 18 A Min 60 40 1.3 28 VDD 48 V, VGS = 10 V, ID = 35 A Typ. 12.5 9.4 55 5120 300 500 6 19 20 115 91 70 21 Max 10 100 2.5 19 12.5 ns nC pF Unit A A V V m S
VDD 30 V Duty 1%, tw = 10 s
Source-Drain Diode Ratings and Characteristics (Ta = 25C)
Characteristics Continuous drain reverse current (Note 1) Pulse drain reverse current (Note 1) Forward voltage (diode) Reverse recovery time Reverse recovery charge Symbol IDR IDRP VDS2F trr Qrr Test Condition IDR1 = 35 A, VGS = 0 V IDR = 35 A, VGS = 0 V, dIDR/dt = 50 A/s Min Typ. 60 58 Max 35 105 -1.5 Unit A A V ns nC
Marking
K3662
Part No. (or abbreviation code) Lot No.
A line indicates lead (Pb)-free package or lead (Pb)-free finish.
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2SK3662
ID - VDS
40 6 8 80 30 10 3.3 20 4 3.5 100 10 6 4.2
ID - VDS
Common source Tc = 25C Pulse test
4
Drain current ID (A)
Drain current ID (A)
3.8 60 3.6 40 3.4 20 VGS = 3 V 0 0
10
VGS = 3 V Common source Tc = 25C Pulse test
0 0
0.2
0.4
0.6
0.8
1.0
1
2
3
4
5
Drain-source voltage
VDS (V)
Drain-source voltage
VDS (V)
ID - VGS
100 Common source VDS = 10 V Pulse test 1.0
VDS - VGS
Common source Tc = 25C Pulse test
VDS (V) Drain-source voltage
80
0.8
Drain current ID (A)
60
0.6
40
0.4
ID = 35 A
20 Tc = -55C 0 0 1 2 3
100 25 4 5
0.2
17 9
0 0
4
8
12
16
20
Gate-source voltage
VGS (V)
Gate-source voltage
VGS (V)
Yfs - ID
300 Common source VDS = 10 V Pulse test 100 Tc = -55C
RDS (ON) - ID
50
(S)
Forward transfer admittance Yfs
Drain-source on resistance RDS (ON) (m)
Common source 30 Tc = 25C Pulse test 4 10 VGS = 10 V 5 3
50 100 30
25
10
5 1
3
5
10
30
50
100
1 1
3
5
10
30
50
100
Drain current ID (A)
Drain current ID (A)
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2SK3662
RDS (ON) - Tc
(m)
25 Common source 20 Pulse test 17 A, 9 A 100
IDR - VDS
Drain-source on resistance RDS (ON)
(A)
10
15
ID = 35 A VGS = 4 V
Drain reverse current IDR
5
10
3
10
VGS = 10 V ID = 35 A, 17 A, 9 A
5
Common source Tc = 25C VGS = 0 V Pulse test -0.8 -1.0 -1.2 -1.4 -1.6
0 -80
-40
0
40
80
120
160
1 0
-0.2
-0.4
-0.6
Case temperature Tc (C)
Drain-source voltage
VDS (V)
Capacitance - VDS
10000 5 Common source VDS = 10 V I = 1 mA 4D Pulse test
Vth - Tc
Ciss
(pF)
Gate threshold voltage
1000
Vth (V)
3
Capacitance C
Coss
2
100 Common source VGS = 0 V f = 1 MHz 10 0.1 Ta = 25C 1 10
Crss
1
0 -80 100
-40
0
40
80
120
160
Case temperature Tc (C)
Drain-source voltage
VDS (V)
PD - Tc
40 Common source VDS = 10 A ID = 1 mA Pulse test 80
Dynamic input/output characteristics
Common source ID = 35 A Tc = 25C Pulse test 16
Drain power dissipation PD (W)
VDS (V)
30
60
12
Drain-source voltage
24 8 VDD = 48 V
20
40
10
20 VGS
4
0 0
40
80
120
160
0 0
40
80
120
0 160
Case temperature Tc (C)
Total gate charge Qg (nC)
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Gate-source voltage
VDS
12
VGS (V)
2SK3662
rth - tw
3
Normalized transient thermal impedance rth (t)/Rth (ch-c)
1 Duty = 0.5 0.3 0.2 0.1 0.1 0.05 0.02 0.01 0.01 Single pulse T Duty = t/T Rth (ch-c) = 3.57C/W 100 1m 10 m 100 m 1 10 PDM t
0.03
0.00 10
Pulse width
tw
(S)
Safe operating area
300 ID max (pulsed)* t = 1 ms* ID max (continuous) 30 250
EAS - Tch
Avalanche energy EAS (mJ)
100
200
(A)
150
Drain current ID
t = 10 ms* 10
100
3
50
1 * Single nonrepetitive pulse 0.3 Tc = 25C Curves must be derated linearly with increase in temperature. 0.1 0.1 1 VDSS max 10 100 0 25 50 75 100 125 150
Channel temperature (initial) Tch (C)
Drain-source voltage
VDS (V)
15 V
-15 V
BVDSS IAR VDD VDS Waveform
AS = 1 B VDSS L I2 B 2 - VDD VDSS
Test circuit
RG = 25 VDD = 25 V, L = 227 H
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RESTRICTIONS ON PRODUCT USE
* The information contained herein is subject to change without notice.
20070701-EN
* TOSHIBA is continually working to improve the quality and reliability of its products. Nevertheless, semiconductor devices in general can malfunction or fail due to their inherent electrical sensitivity and vulnerability to physical stress. It is the responsibility of the buyer, when utilizing TOSHIBA products, to comply with the standards of safety in making a safe design for the entire system, and to avoid situations in which a malfunction or failure of such TOSHIBA products could cause loss of human life, bodily injury or damage to property. In developing your designs, please ensure that TOSHIBA products are used within specified operating ranges as set forth in the most recent TOSHIBA products specifications. Also, please keep in mind the precautions and conditions set forth in the "Handling Guide for Semiconductor Devices," or "TOSHIBA Semiconductor Reliability Handbook" etc. * The TOSHIBA products listed in this document are intended for usage in general electronics applications (computer, personal equipment, office equipment, measuring equipment, industrial robotics, domestic appliances, etc.).These TOSHIBA products are neither intended nor warranted for usage in equipment that requires extraordinarily high quality and/or reliability or a malfunction or failure of which may cause loss of human life or bodily injury ("Unintended Usage"). Unintended Usage include atomic energy control instruments, airplane or spaceship instruments, transportation instruments, traffic signal instruments, combustion control instruments, medical instruments, all types of safety devices, etc.. Unintended Usage of TOSHIBA products listed in his document shall be made at the customer's own risk. * The products described in this document shall not be used or embedded to any downstream products of which manufacture, use and/or sale are prohibited under any applicable laws and regulations. * The information contained herein is presented only as a guide for the applications of our products. No responsibility is assumed by TOSHIBA for any infringements of patents or other rights of the third parties which may result from its use. No license is granted by implication or otherwise under any patents or other rights of TOSHIBA or the third parties. * Please contact your sales representative for product-by-product details in this document regarding RoHS compatibility. Please use these products in this document in compliance with all applicable laws and regulations that regulate the inclusion or use of controlled substances. Toshiba assumes no liability for damage or losses occurring as a result of noncompliance with applicable laws and regulations.
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